| standard name | Item | Conforming | |
|---|---|---|---|
| Single phase | Three-phase | ||
| IEC61000-4-11 Voltage dips, short interruptions, and voltage variations | Voltage dip | ✓ *1 | ✓ *1 |
| Short interruption | ✓ *1 | ✓ *1 | |
| Voltage fluctuation | ✓ | ✓ | |
| IEC61000-4-13 Harmonics and interharmonics | Flat curve | ✓ | ✓ |
| Over swing | ✓ | ✓ | |
| Sweep in frequency | ✓ | ✓ | |
| Odd, non multiple of 3 | ✓ | ✓ | |
| Odd, multiple of 3 | ✓ | ✓ | |
| Even harmonics | ✓ | ✓ | |
| Interharmonics | ✓ | ✓ | |
| Meister curve | ✓ | ✓ | |
| IEC61000-4-14 Voltage fluctuation | Voltage swing | ✓ | ✓ |
| Interval | ✓ | ✓ | |
| IEC61000-4-17 Ripple on d.c. input power port | Single-phase rectifier circuit | ✓ | – |
| Three-phase rectifier circuit | ✓ | – | |
| IEC61000-4-27 Unbalance | Unbalance | – | ▲ *2 |
| IEC61000-4-28 Variation of power frequency | Frequency variations | ✓ | ✓ |
| IEC61000-4-29 Voltage dips, short interruptions, and voltage variations on d.c. input power port | Voltage dip | ✓ | – |
| Short interruption | ▲ *3 | – | |
| Voltage fluctuation | ✓ | – | |
| IEC61000-4-34 Voltage dips, short interruptions, and voltage variations | Voltage dip | ▲ *4 | ▲ *4 |
| Short interruption | ▲ *4 | ▲ *4 | |
| Voltage fluctuation | ✓ | ✓ | |
*1 Conforms to the standard when used in combination with IEC Dip Simulator DSI series. If using the PCR-WEA/WEA2 alone, the voltage dips and short-time power failures are preliminary tests. *2 110 %, 95.2 %, 93.5 %, 90 %, 87 %, 80 %, 74 %, 71 %, 66 % need to respond to sudden changes of 1 μs to 5 μs. The voltage response of PCR-WEA/WEA2 is more than 40 μs at FAST, which is a preliminary test. *3 Must support output impedance greater than 100 kΩ. The PCR-WEA/WEA2 output impedance is less than 100 kΩ and therefore designed for preliminary testing purposes. Only PCR12000WEA2R conforms to the standards. *4 The device between the range of 16A to 75 A requires having the capability of rapid change with 1 μs to 5 μs. The device exceeding 75 A is not required to have the capability of rapid change with 1μs to 5 μs. (It is relaxed to 1 μs to 50 μs for the device exceeding 75 A.)
